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[IEEE 2010 15th IEEE European Test Symposium (ETS) - Praha, Czech Republic (2010.05.24-2010.05.28)] 2010 15th IEEE European Test Symposium - Modified T-Flip-Flop based scan cell for RAS

✍ Scribed by Adiga, Raghavendra; Arpit, Gandhi; Singh, Virendra; Saluja, Kewal K; Singh, Adit D.

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