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[IEEE 2010 12th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) - Las Vegas, NV, USA (2010.06.2-2010.06.5)] 2010 12th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems - Thermal conductivity and boundary resistance measurements of GeSbTe and electrode materials using nanosecond thermoreflectance

โœ Scribed by Bozorg-Grayeli, E.; Reifenberg, J.P.; Chang, K.W.; Panzer, M.; Goodson, K.E.


Book ID
121678907
Publisher
IEEE
Year
2010
Weight
327 KB
Category
Article
ISBN
1424453429

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