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[IEEE 2010 12th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) - Las Vegas, NV, USA (2010.06.2-2010.06.5)] 2010 12th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems - Design challenges of thermal margining tools for silicon validation

✍ Scribed by Mohammed, Rahima K.; Sahan, Ridvan A.; Prabhugoud, Mohanraj

Book ID: 118011842
Publisher: IEEE
Year: 2010
Weight: 987 KB
Volume: 0
Category: Article
ISBN: 1424453429
DOI: 10.1109/itherm.2010.5501262

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