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[IEEE 2010 12th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) - Las Vegas, NV, USA (2010.06.2-2010.06.5)] 2010 12th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems - Random vibration test for electronic assemblies fatigue life estimation

✍ Scribed by Al-Yafawi, Abdullah; Patil, Saket; Yu, Da; Park, Seungbae; Pitarresi, James; Goo, Namseo

Book ID: 121248793
Publisher: IEEE
Year: 2010
Weight: 984 KB
Category: Article
ISBN: 1424453429
DOI: 10.1109/ITHERM.2010.5501295

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