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[IEEE 2009 International Conference on Test and Measurement (ICTM) - Hong Kong, Hong Kong (2009.12.5-2009.12.6)] 2009 International Conference on Test and Measurement - Application of artificial intelligence in computer aided instruction

✍ Scribed by Huoyou Li,

Book ID: 121288411
Publisher: IEEE
Year: 2009
Weight: 696 KB
Category: Article
ISBN: 1424446996
DOI: 10.1109/ICTM.2009.5413068

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