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[IEEE 2009 International Conference on Test and Measurement (ICTM) - Hong Kong, Hong Kong (2009.12.5-2009.12.6)] 2009 International Conference on Test and Measurement - Research about human face recognition technology

✍ Scribed by Chenggang Zhen, ; Yingmei Su,

Book ID: 121197893
Publisher: IEEE
Year: 2009
Weight: 526 KB
Category: Article
ISBN: 1424446996
DOI: 10.1109/ICTM.2009.5412901

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