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[IEEE 2009 International Conference on Test and Measurement (ICTM) - Hong Kong, Hong Kong (2009.12.5-2009.12.6)] 2009 International Conference on Test and Measurement - XML-based information integration for e-Commerce

✍ Scribed by Junya Chen, ; Yu Bai,

Book ID: 118024622
Publisher: IEEE
Year: 2009
Weight: 770 KB
Volume: 0
Category: Article
ISBN: 1424446996
DOI: 10.1109/ictm.2009.5413014

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