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[IEEE 2009 IEEE Workshop on Microelectronics and Electron Devices (WMED) - Boise, Idaho, USA (2009.04.3-2009.04.3)] 2009 IEEE Workshop on Microelectronics and Electron Devices - 3D Simulation Study of Cell-Cell Interference in Advanced NAND Flash Memory

✍ Scribed by Liu, Haitao; Groothuis, Steve; Mouli, Chandra; Li, Jian; Parat, Krishna; Krishnamohan, Tejas

No coin nor oath required. For personal study only.

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