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[IEEE 2009 IEEE Intrumentation and Measurement Technology Conference (I2MTC) - Singapore. Singapore (2009.05.5-2009.05.7)] 2009 IEEE Intrumentation and Measurement Technology Conference - Critical parameters for mutual inductance between Rogowski coil and primary conductor

โœ Scribed by Becherini, G.; Di Fraia, S.; Marracci, M.; Tellini, B.; Zappacosta, C.; Robles, G.


Book ID
120604325
Publisher
IEEE
Year
2009
Weight
613 KB
Category
Article
ISBN
1424433525

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