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[IEEE 2009 IEEE Intrumentation and Measurement Technology Conference (I2MTC) - Singapore. Singapore (2009.05.5-2009.05.7)] 2009 IEEE Intrumentation and Measurement Technology Conference - Critical parameters for mutual inductance between Rogowski coil and primary conductor

✍ Scribed by Becherini, G.; Di Fraia, S.; Marracci, M.; Tellini, B.; Zappacosta, C.; Robles, G.

Book ID: 120604325
Publisher: IEEE
Year: 2009
Weight: 613 KB
Category: Article
ISBN: 1424433525
DOI: 10.1109/IMTC.2009.5168487

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