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[IEEE 2009 IEEE Intrumentation and Measurement Technology Conference (I2MTC) - Singapore. Singapore (2009.05.5-2009.05.7)] 2009 IEEE Intrumentation and Measurement Technology Conference - Test vector compression technique in system-on-chip

✍ Scribed by Biswas, Satyendra N.; Das, Sunil R.; Assaf, Mansour H.; Hossain, Altaf

Book ID: 126680330
Publisher: IEEE
Year: 2009
Weight: 435 KB
Category: Article
ISBN: 1424433525
DOI: 10.1109/IMTC.2009.5168623

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