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[IEEE 2009 IEEE Intrumentation and Measurement Technology Conference (I2MTC) - Singapore. Singapore (2009.05.5-2009.05.7)] 2009 IEEE Intrumentation and Measurement Technology Conference - Fast iris localization in recognition systems

✍ Scribed by Yazdanpanah, Maryam; Amini, Ehsan

Book ID: 125517770
Publisher: IEEE
Year: 2009
Weight: 939 KB
Category: Article
ISBN: 1424433525
DOI: 10.1109/IMTC.2009.5168598

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