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[IEEE 2009 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT) - Hsinchu, Taiwan (2009.08.31-2009.09.2)] 2009 IEEE International Workshop on Memory Technology, Design, and Testing - A New SRAM Cell Design for Both Power and Performance Efficiency

✍ Scribed by Chiang, Yen-Ting; Chang, Yen-Jen

Book ID: 120302552
Publisher: IEEE
Year: 2009
Weight: 337 KB
Category: Article
ISBN: 0769537979
DOI: 10.1109/MTDT.2009.13

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