[IEEE 2009 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT) - Hsinchu, Taiwan (2009.08.31-2009.09.2)] 2009 IEEE International Workshop on Memory Technology, Design, and Testing - A Micro-Watt Multi-port Register File with Wide Operating Voltage Range

✍ Scribed by Yang, Shyh-Chyi; Yang, Hao-I; Hwang, Wei

• Book ID: 115492887
• Publisher: IEEE
• Year: 2009
• Weight: 688 KB
• Volume: 0
• Category: Article
• ISBN: 0769537979
• DOI: 10.1109/mtdt.2009.16