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[IEEE 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis - Chengdu , China (2009.04.28-2009.04.29)] 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis - Synthesis of Fault Tolerant Reversible Logic Circuits

✍ Scribed by Islam, Md. Saiful; Rahman, M. M.; Begum, Zerina; Hafiz, Mohd. Zulfiquar; Mahmud, Abdullah Al

Book ID: 125503331
Publisher: IEEE
Year: 2009
Weight: 236 KB
Category: Article
ISBN: 1424425875
DOI: 10.1109/CAS-ICTD.2009.4960883

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