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[IEEE 2009 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM - Capri, Italy (2009.10.12-2009.10.14)] 2009 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - Distributed de-embedding technique for accurate on-chip passive measurements based on Open-Short structures

✍ Scribed by Veenstra, H.; Notten, M. G. M.; van Goor, D.; Mills, J. B.

Book ID: 126748811
Publisher: IEEE
Year: 2009
Weight: 370 KB
Category: Article
ISBN: 1424448948
DOI: 10.1109/BIPOL.2009.5314136

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