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[IEEE 2009 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM - Capri, Italy (2009.10.12-2009.10.14)] 2009 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - Parametric mismatch characterization for mixed-signal technologies

✍ Scribed by Tuinhout, Hans; Wils, Nicole

Book ID: 118166120
Publisher: IEEE
Year: 2009
Weight: 763 KB
Volume: 0
Category: Article
ISBN: 1424448948
DOI: 10.1109/bipol.2009.5314132

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