𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2009 74th ARFTG Microwave Measurement Conference - Broomfield, CO, USA (2009.11.30-2009.12.4)] 2009 74th ARFTG Microwave Measurement Conference - Analysis of an RF power amplifier for envelope tracking based on load-pull data

✍ Scribed by Ubostad, Marius; Olavsbraten, Morten

Book ID: 126566025
Publisher: IEEE
Year: 2009
Weight: 781 KB
Category: Article
ISBN: 1424457122
DOI: 10.1109/ARFTG74.2009.5439102

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2009 74th ARFTG Microwave Measurem

[IEEE 2009 74th ARFTG Microwave Measurement Conference - Broomfield, CO, USA (2009.11.30-2009.12.4)] 2009 74th ARFTG Microwave Measurement Conference - Assessing the performance of uncertainty calculations by simulation

✍ Hall, B. D. 📂 Article 📅 2009 🏛 IEEE ⚖ 569 KB

[IEEE 2009 74th ARFTG Microwave Measurem

[IEEE 2009 74th ARFTG Microwave Measurement Conference - Broomfield, CO, USA (2009.11.30-2009.12.4)] 2009 74th ARFTG Microwave Measurement Conference - Use of a step-response approximation for thermal transient modeling in power MOSFETs

✍ Baylis, Charles; Perry, Joseph; Moldovan, Matthew; Marks, Robert J.; Dunleavy, L 📂 Article 📅 2009 🏛 IEEE ⚖ 563 KB

[IEEE 2009 74th ARFTG Microwave Measurem

[IEEE 2009 74th ARFTG Microwave Measurement Conference - Broomfield, CO, USA (2009.11.30-2009.12.4)] 2009 74th ARFTG Microwave Measurement Conference - Duty cycle dependent pulsed IV simulation and thermal time constant model fitting for LDMOS transistors

✍ Meena, Sivalingam Somasundaram; Baylis, Charles; Dunleavy, Lawrence; Marbell, Ma 📂 Article 📅 2009 🏛 IEEE ⚖ 577 KB

[IEEE 2009 74th ARFTG Microwave Measurem

[IEEE 2009 74th ARFTG Microwave Measurement Conference - Broomfield, CO, USA (2009.11.30-2009.12.4)] 2009 74th ARFTG Microwave Measurement Conference - Improved mathematical model for the investigation of deep traps into semiconductor devices: application to Metamorphic HEMT

✍ Jaafar, M.; Aupetit-Berthelemot, C.; Cluzeau, T.; Teyssier, J. P. 📂 Article 📅 2009 🏛 IEEE ⚖ 764 KB