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[IEEE 2009 74th ARFTG Microwave Measurement Conference - Broomfield, CO, USA (2009.11.30-2009.12.4)] 2009 74th ARFTG Microwave Measurement Conference - Improved mathematical model for the investigation of deep traps into semiconductor devices: application to Metamorphic HEMT

✍ Scribed by Jaafar, M.; Aupetit-Berthelemot, C.; Cluzeau, T.; Teyssier, J. P.

No coin nor oath required. For personal study only.

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