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[IEEE 2009 74th ARFTG Microwave Measurement Conference - Broomfield, CO, USA (2009.11.30-2009.12.4)] 2009 74th ARFTG Microwave Measurement Conference - Duty cycle dependent pulsed IV simulation and thermal time constant model fitting for LDMOS transistors

✍ Scribed by Meena, Sivalingam Somasundaram; Baylis, Charles; Dunleavy, Lawrence; Marbell, Marvin

No coin nor oath required. For personal study only.

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