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[IEEE 2009 25th Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (2009.03.15-2009.03.19)] 2009 25th Annual IEEE Semiconductor Thermal Measurement and Management Symposium - How to evaluate transient dual interface measurements of the Rth-JC of power semiconductor packages

✍ Scribed by Schweitzer, Dirk; Pape, Heinz; Kutscherauer, Rudolf; Walder, Martin

Book ID: 126670843
Publisher: IEEE
Year: 2009
Weight: 234 KB
Category: Article
ISBN: 1424436648
DOI: 10.1109/STHERM.2009.4810760

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