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[IEEE 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT) - Chicago, Illinois, USA (2009.10.7-2009.10.9)] 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - On the Functional Qualification of a Platform Model

✍ Scribed by Di Guglielmo, Giuseppe; Fummi, Franco; Pravadelli, Graziano; Hampton, Mark; Letombe, Florian

Book ID: 120648065
Publisher: IEEE
Year: 2009
Weight: 381 KB
Category: Article
ISBN: 0769538398
DOI: 10.1109/DFT.2009.15

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