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[IEEE 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT) - Chicago, Illinois, USA (2009.10.7-2009.10.9)] 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Error Control Coding for Multilevel Cell Flash Memories Using Nonbinary Low-Density Parity-Check Codes

โœ Scribed by Maeda, Yuu; Kaneko, Haruhiko


Book ID
120229868
Publisher
IEEE
Year
2009
Weight
589 KB
Category
Article
ISBN
0769538398

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