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[IEEE 2009 14th IEEE European Test Symposium (ETS) - Sevilla, Spain (2009.05.25-2009.05.29)] 2009 14th IEEE European Test Symposium - Partial Scan Approach for Secret Information Protection

✍ Scribed by Inoue, Michiko; Yoneda, Tomokazu; Hasegawa, Muneo; Fujiwara, Hideo

No coin nor oath required. For personal study only.

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