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[IEEE 2009 14th IEEE European Test Symposium (ETS) - Sevilla, Spain (2009.05.25-2009.05.29)] 2009 14th IEEE European Test Symposium - On Minimization of Peak Power for Scan Circuit during Test

✍ Scribed by Tudu, Jaynarayan T.; Larsson, Erik; Singh, Virendra; Agrawal, Vishwani D.

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