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[IEEE 2008 13th IEEE European Test Symposium (ETS) - Verbania, italy (2008.05.25-2008.05.29)] 2008 13th European Test Symposium - A Capture-Safe Test Generation Scheme for At-Speed Scan Testing

✍ Scribed by Wen, X.; Miyase, K.; Kajihara, S.; Furukawa, H.; Yamato, Y.; Takashima, A.; Noda, K.; Ito, H.; Hatayama, K.; Aikyo, T.; Saluja, K. K.

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