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[IEEE 2008 13th IEEE European Test Symposium (ETS) - Verbania, italy (2008.05.25-2008.05.29)] 2008 13th European Test Symposium - Tunable Transient Filters for Soft Error Rate Reduction in Combinational Circuits

✍ Scribed by Zhou, Quming; Choudhury, Mihir R.; Mohanram, Kartik

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