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[IEEE 2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems - Liberec, Czech Republic (2009.04.15-2009.04.17)] 2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems - An analysis of the timing behavior of CMOS digital blocks under Simultaneous Switching Noise conditions

✍ Scribed by Azais, F.; Bertrand, Y.; Renovell, M.

Book ID: 126675895
Publisher: IEEE
Year: 2009
Weight: 592 KB
Category: Article
ISBN: 142443341X
DOI: 10.1109/DDECS.2009.5012119

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