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[IEEE 2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems - Liberec, Czech Republic (2009.04.15-2009.04.17)] 2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems - A scheme of logic self repair including local interconnects

✍ Scribed by Koal, T.; Scheit, D.; Vierhaus, H. T.

Book ID: 126611770
Publisher: IEEE
Year: 2009
Tongue: English
Weight: 233 KB
Category: Article
ISBN: 142443341X
DOI: 10.1109/DDECS.2009.5012088

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