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[IEEE 2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems - Liberec, Czech Republic (2009.04.15-2009.04.17)] 2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems - Test scheme for switched-capacitor circuits by digital analyses

✍ Scribed by Yun-Che Wen,

Book ID: 126754654
Publisher: IEEE
Year: 2009
Weight: 376 KB
Category: Article
ISBN: 142443341X
DOI: 10.1109/DDECS.2009.5012113

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