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[IEEE 2009 10th International Symposium on Quality of Electronic Design (ISQED) - San Jose, CA, USA (2009.03.16-2009.03.18)] 2009 10th International Symposium on Quality of Electronic Design - Statistical static performance analysis of asynchronous circuits considering process variation

✍ Scribed by Raji, Mohsen; Ghavami, Behnam; Pedram, Hossein

Book ID: 118036283
Publisher: IEEE
Year: 2009
Tongue: English
Weight: 330 KB
Volume: 0
Category: Article
ISBN: 1424429528
DOI: 10.1109/isqed.2009.4810310

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