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[IEEE 2009 10th International Symposium on Quality of Electronic Design (ISQED) - San Jose, CA, USA (2009.03.16-2009.03.18)] 2009 10th International Symposium on Quality of Electronic Design - Efficient statistical analysis of read timing failures in SRAM circuits

โœ Scribed by Yaldiz, Soner; Arslan, Umut; Li, Xin; Pileggi, Larry


Book ID
120302539
Publisher
IEEE
Year
2009
Tongue
English
Weight
726 KB
Category
Article
ISBN
1424429528

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