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[IEEE 2009 10th International Symposium on Quality of Electronic Design (ISQED) - San Jose, CA, USA (2009.03.16-2009.03.18)] 2009 10th International Symposium on Quality of Electronic Design - Parametric analysis to determine accurate interconnect extraction corners for design performance

โœ Scribed by Mutlu, Ayhan; Le, Jiayong; Molina, Ruben; Celik, Mustafa


Book ID
126696999
Publisher
IEEE
Year
2009
Weight
922 KB
Category
Article
ISBN
1424429528

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