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[IEEE 2009 10th International Conference on Ultimate Integration on Silicon (ULIS - Aachen, Germany (2009.03.18-2009.03.20)] 2009 10th International Conference on Ultimate Integration of Silicon - Effect of access resistance on apparent mobility reduction in nano-MOSFET

✍ Scribed by Huet, K.; Saint-Martin, J.; Bournel, A.; Querlioz, D.; Dollfus, P.

Book ID: 126767602
Publisher: IEEE
Year: 2009
Weight: 570 KB
Category: Article
ISBN: 1424437040
DOI: 10.1109/ULIS.2009.4897533

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