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[IEEE 2009 10th International Conference on Ultimate Integration on Silicon (ULIS - Aachen, Germany (2009.03.18-2009.03.20)] 2009 10th International Conference on Ultimate Integration of Silicon - Pockets engineering impact on mismatch performance on 45nm MOSFET technologies

✍ Scribed by Mezzomo, Cecilia M.; Leyris, Cedric; Josse, Emmanuel; Ghibaudo, Gerard

Book ID: 126649574
Publisher: IEEE
Year: 2009
Weight: 570 KB
Category: Article
ISBN: 1424437040
DOI: 10.1109/ULIS.2009.4897528

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