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[IEEE 2008 Symposium on VLSI Technology - Honolulu, HI, USA (2008.06.17-2008.06.19)] 2008 Symposium on VLSI Technology - Novel integration process and performances analysis of Low STandby Power (LSTP) 3D multi-channel CMOSFET (MCFET) on SOI with metal / high-K gate stack

✍ Scribed by Bernard, E.; Ernst, T.; Guillaumot, B.; Vulliet, N.; Barral, V.; Maffini-Alvaro, V.; Andrieu, F.; Vizioz, C.; Campidelli, Y.; Gautier, P.; Hartmann, J.M.; Kies, R.; Delaye, V.; Aussenac, F.; Poiroux, T.; Coronel, P.; Souifi, A.; Skotnicki, T.; Deleonibus, S.

Book ID: 126594185
Publisher: IEEE
Year: 2008
Weight: 416 KB
Category: Article
ISBN: 142441802X
DOI: 10.1109/VLSIT.2008.4588546

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