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[IEEE 2008 International Workshop on Innovative Architecture for Future Generation High-Performance Processors and Systems (IWIA) - Hilo, HI, USA (2008.01.21-2008.01.23)] 2008 International Workshop on Innovative Architecture for Future Generation High-Performance Processors and Systems - Register File Reliability Analysis Through Cycle-Accurate Thermal Emulation

✍ Scribed by Ayala, José L.; Valle, Pablo G. Del; Atienza, David

Book ID: 126729860
Publisher: IEEE
Year: 2008
Weight: 295 KB
Category: Article
ISBN: 142446465X
DOI: 10.1109/IWIA.2008.7

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