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[IEEE 2008 International Solid-State Circuits Conference - (ISSCC) - San Francisco, CA, USA (2008.02.3-2008.02.7)] 2008 IEEE International Solid-State Circuits Conference - Digest of Technical Papers - 90nm 4.7ps-Resolution 0.7-LSB Single-Shot Precision and 19pJ-per-Shot Local Passive Interpolation Time-to-Digital Converter with On-Chip Characterization

✍ Scribed by Henzler, Stephan; Koeppe, Siegmar; Kamp, Winfried; Mulatz, Hans; Schmitt-Landsiedel, Doris

Book ID: 118229952
Publisher: IEEE
Year: 2008
Weight: 399 KB
Volume: 0
Category: Article
ISBN: 1424420113
DOI: 10.1109/isscc.2008.4523300

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