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[IEEE 2008 International Solid-State Circuits Conference - (ISSCC) - San Francisco, CA, USA (2008.02.3-2008.02.7)] 2008 IEEE International Solid-State Circuits Conference - Digest of Technical Papers - A 1V 11b 200MS/s Pipelined ADC with Digital Background Calibration in 65nm CMOS

✍ Scribed by Hsueh, Kang-Wei; Chou, Yu-Kai; Tu, Yu-Hsuan; Chen, Yi-Fu; Yang, Ya-Lun; Li, Hung-Sung

Book ID: 111916217
Publisher: IEEE
Year: 2008
Weight: 673 KB
Volume: 0
Category: Article
ISBN: 1424420113
DOI: 10.1109/isscc.2008.4523299

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