[IEEE 2008 IEEE International Symposium on Electromagnetic Compatibility - EMC 2008 - Detroit, MI (2008.08.18-2008.08.22)] 2008 IEEE International Symposium on Electromagnetic Compatibility - Shielding analysis of enclosure with aperture irradiated by plane wave with arbitrary incident angle and polarization direction

✍ Scribed by Dan Shi, ; Yuanmao Shen, ; Fangmin Ruan, ; Zhongan Wei, ; Yougang Gao,

• Book ID: 120579295
• Publisher: IEEE
• Year: 2008
• Weight: 249 KB
• Category: Article
• ISBN: 142441699X
• DOI: 10.1109/ISEMC.2008.4652130