[IEEE 2008 IEEE International Symposium on Electromagnetic Compatibility - EMC 2008 - Detroit, MI (2008.08.18-2008.08.22)] 2008 IEEE International Symposium on Electromagnetic Compatibility - Problematic concepts in the introduction of EMC

✍ Scribed by de Beer, Arnold S.

• Book ID: 120890183
• Publisher: IEEE
• Year: 2008
• Weight: 245 KB
• Category: Article
• ISBN: 142441699X
• DOI: 10.1109/ISEMC.2008.4652120