𝔖 Bobbio Scriptorium

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[IEEE 2008 IEEE International Symposium on Electromagnetic Compatibility - EMC 2008 - Detroit, MI (2008.08.18-2008.08.22)] 2008 IEEE International Symposium on Electromagnetic Compatibility - Shielding effectiveness with a twist

✍ Scribed by Keebler, P. F.; Phipps, K. O.

Book ID: 120569825
Publisher: IEEE
Year: 2008
Weight: 381 KB
Category: Article
ISBN: 142441699X
DOI: 10.1109/ISEMC.2008.4652128

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