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[IEEE 2008 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2008.12.15-2008.12.17)] 2008 IEEE International Electron Devices Meeting - Feedback FET: A novel transistor exhibiting steep switching behavior at low bias voltages

✍ Scribed by Padilla, Alvaro; Chun Wing Yeung, ; Shin, Changhwan; Hu, Chenming; Tsu-Jae King Liu,

Book ID: 120298901
Publisher: IEEE
Year: 2008
Weight: 1006 KB
Category: Article
ISBN: 1424423775
DOI: 10.1109/IEDM.2008.4796643

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