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[IEEE 2008 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2008.12.15-2008.12.17)] 2008 IEEE International Electron Devices Meeting - A unified 7.5nm dash-type confined cell for high performance PRAM device

✍ Scribed by Im, D.H.; Lee, J. I.; Cho, S.L.; An, H.G.; Kim, D.H.; Kim, I.S.; Park, H.; Ahn, D.H.; Horii, H.; Park, S.O.; Chung, U-In; Moon, J.T.

Book ID: 120027355
Publisher: IEEE
Year: 2008
Weight: 816 KB
Category: Article
ISBN: 1424423775
DOI: 10.1109/IEDM.2008.4796654

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