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[IEEE 2008 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2008.12.15-2008.12.17)] 2008 IEEE International Electron Devices Meeting - Impact of SOI, Si1-xGexOI and GeOI substrates on CMOS compatible Tunnel FET performance

✍ Scribed by Mayer, F.; Le Royer, C.; Damlencourt, J.-F.; Romanjek, K.; Andrieu, F.; Tabone, C.; Previtali, B.; Deleonibus, S.

Book ID: 115494373
Publisher: IEEE
Year: 2008
Weight: 922 KB
Volume: 0
Category: Article
ISBN: 1424423775
DOI: 10.1109/iedm.2008.4796641

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