𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2008 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2008.12.15-2008.12.17)] 2008 IEEE International Electron Devices Meeting - Oxide-based RRAM switching mechanism: A new ion-transport-recombination model

✍ Scribed by Gao, B.; Yu, S.; Xu, N.; Liu, L.F.; Sun, B.; Liu, X.Y.; Han, R.Q.; Kang, J.F.; Yu, B.; Wang, Y.Y.

Book ID: 115449426
Publisher: IEEE
Year: 2008
Weight: 718 KB
Volume: 0
Category: Article
ISBN: 1424423775
DOI: 10.1109/iedm.2008.4796751

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2008 IEEE International Electron D

[IEEE 2008 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2008.12.15-2008.12.17)] 2008 IEEE International Electron Devices Meeting - Chemical mechanical polish: The enabling technology

✍ Steigerwald, Joseph M. 📂 Article 📅 2008 🏛 IEEE ⚖ 979 KB

[IEEE 2008 IEEE International Electron D

[IEEE 2008 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2008.12.15-2008.12.17)] 2008 IEEE International Electron Devices Meeting - Session 21: Solid-state and nanoelectronic devices carbon-based devices

✍ Jing Kong, ; Tsu-Jae King Liu, 📂 Article 📅 2008 🏛 IEEE 🌐 English ⚖ 100 KB

[IEEE 2008 IEEE International Electron D

[IEEE 2008 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2008.12.15-2008.12.17)] 2008 IEEE International Electron Devices Meeting - Designing smart temperature sensors in standard CMOS

✍ Makinwa, Kofi A. A. 📂 Article 📅 2008 🏛 IEEE ⚖ 93 KB

[IEEE 2008 IEEE International Electron D

[IEEE 2008 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2008.12.15-2008.12.17)] 2008 IEEE International Electron Devices Meeting - Shot noise in quasi one-dimensional FETs

✍ Betti, A.; Fiori, G.; Iannaccone, G. 📂 Article 📅 2008 🏛 IEEE ⚖ 404 KB

[IEEE 2008 IEEE International Electron D

[IEEE 2008 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2008.12.15-2008.12.17)] 2008 IEEE International Electron Devices Meeting - Rapid design flows for advanced technology pathfinding

✍ Christie, P.; Nackaerts, A.; Kumar, A.; Terechko, A. S.; Doornbos, G. 📂 Article 📅 2008 🏛 IEEE ⚖ 246 KB

[IEEE 2008 IEEE International Electron D

[IEEE 2008 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2008.12.15-2008.12.17)] 2008 IEEE International Electron Devices Meeting - PV Technology trends and Industry's Role

✍ Asano, Naoki; Saga, Tatsuo 📂 Article 📅 2008 🏛 IEEE ⚖ 376 KB