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[IEEE 2008 IEEE International Conference on Computer Design (ICCD) - Lake Tahoe, CA, USA (2008.10.12-2008.10.15)] 2008 IEEE International Conference on Computer Design - In-field NoC-based SoC testing with distributed test vector storage

✍ Scribed by Lee, Jason D.; Mahapatra, Rabi N.

Book ID: 121289088
Publisher: IEEE
Year: 2008
Weight: 662 KB
Category: Article
ISBN: 142442657X
DOI: 10.1109/ICCD.2008.4751863

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