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[IEEE 2008 IEEE International Conference on Computer Design (ICCD) - Lake Tahoe, CA, USA (2008.10.12-2008.10.15)] 2008 IEEE International Conference on Computer Design - A novel, highly SEU tolerant digital circuit design approach

✍ Scribed by Garg, Rajesh; Khatri, Sunil P.

Book ID: 118179561
Publisher: IEEE
Year: 2008
Weight: 627 KB
Volume: 0
Category: Article
ISBN: 142442657X
DOI: 10.1109/iccd.2008.4751834

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