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[IEEE 2008 IEEE International Conference on Computer Design (ICCD) - Lake Tahoe, CA, USA (2008.10.12-2008.10.15)] 2008 IEEE International Conference on Computer Design - Test cost minimization through adaptive test development

โœ Scribed by Chen, Mingjing; Orailoglu, Alex


Book ID
120735140
Publisher
IEEE
Year
2008
Weight
584 KB
Category
Article
ISBN
142442657X

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