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[IEEE 2008 IEEE Holm Conference on Electrical Contacts (Holm 2008) - Orlando, Florida (2008.10.27-2008.10.29)] 2008 Proceedings of the 54th IEEE Holm Conference on Electrical Contacts - Auger Electron Spectroscopic (AES) Measurements on High Aspect Ratio Tin Whiskers

✍ Scribed by Rodekohr, C. L.; Flowers, G. T.; Suhling, J. C.; Bozack, M. J.

Book ID: 126982624
Publisher: IEEE
Year: 2008
Weight: 804 KB
Category: Article
ISBN: 1424419018
DOI: 10.1109/holm.2008.ecp.49

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