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[IEEE 2008 IEEE Holm Conference on Electrical Contacts (Holm 2008) - Orlando, Florida (2008.10.27-2008.10.29)] 2008 Proceedings of the 54th IEEE Holm Conference on Electrical Contacts - Electrical Contact Resistance Considering Multi-Scale Roughness

✍ Scribed by Wilson, W. Everett; Angadi, Santosh V.; Jackson, Robert L.

Book ID: 120796763
Publisher: IEEE
Year: 2008
Weight: 267 KB
Category: Article
ISBN: 1424419018
DOI: 10.1109/HOLM.2008.ECP.43

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